عرض عادي
Microwave scattering and emission models and their applications / Adrian K. Fung, K.S. Chen.
نوع المادة :
نصالسلاسل:The Artech House remote sensing seriesالناشر:Boston : Artech House, [2010]تاريخ حقوق النشر: ©2010وصف:xviii, 430 pages : illustrations ; 24 cm + 1 CD-ROM (4 3/4 in.)نوع المحتوى:- text
- unmediated
- volume
- 9781608070374
- 1608070379
- TK6592.B57 F86 2010
المحتويات:
Introduction to microwave scattering and emission models for users -- The small perturbation surface backscattering model -- The simplified integral equation surface backscattering model -- The IEM-B surface backscattering model -- Backscattering from multiscale surfaces -- Bistatic properties of the IEM-B surface scattering model -- The standard moment method -- Model for scattering from a low-dielectric layer of Rayleigh scatterers with irregular layer boundaries -- Emission models for rough surfaces and a Rayleigh layer with irregular layer boundaries.
| نوع المادة | المكتبة الحالية | رقم الطلب | رقم النسخة | حالة | تاريخ الإستحقاق | الباركود | |
|---|---|---|---|---|---|---|---|
كتاب
|
UAE Federation Library | مكتبة اتحاد الإمارات General Collection | المجموعات العامة | TK6592.B57 F86 2010 (إستعراض الرف(يفتح أدناه)) | C.1 | Library Use Only | داخل المكتبة فقط | 30020000011526 |
Browsing UAE Federation Library | مكتبة اتحاد الإمارات shelves, Shelving location: General Collection | المجموعات العامة إغلاق مستعرض الرف(يخفي مستعرض الرف)
| TK6575 M43 2008 Modern radar systems / | TK6575 M43 2008 Modern radar systems / | TK6580 .M66 2015 Adaptive radar resource management / | TK6592.B57 F86 2010 Microwave scattering and emission models and their applications / | TK6592.S95 V36 2011 Synthetic aperture radar polarimetry / | TK6630 .A45 2015 التلفزة المعاصرة : سلطة رابعة أم سلطة مربعة ؟ / | TK6630 .A45 2015 التلفزة المعاصرة : سلطة رابعة أم سلطة مربعة ؟ / |
Introduction to microwave scattering and emission models for users -- The small perturbation surface backscattering model -- The simplified integral equation surface backscattering model -- The IEM-B surface backscattering model -- Backscattering from multiscale surfaces -- Bistatic properties of the IEM-B surface scattering model -- The standard moment method -- Model for scattering from a low-dielectric layer of Rayleigh scatterers with irregular layer boundaries -- Emission models for rough surfaces and a Rayleigh layer with irregular layer boundaries.
